Bistel has introduced a cloud-based fault detection system that leverages machine learning for trace analysis. It is intended to give operators in the semiconductor industry a more comprehensive method for detecting faults. The fault detection and classification system (FDC) is called Dynamic Fault Detection (DFD). The system establishes trace references dynamically and does not rely solely on the traditional control limiting methods. It also uses artificial intelligence to develop smarter algorithms to better distinguish between real alarms and false alarms.
The company’s intelligent manufacturing solutions collect and manage data, monitor the health of equipment, optimize process flows, analyze large data, identify root cause failures to mitigate risk, predict issues before they occur and extend the life of equipment through predictive analytics. DFD enables semiconductor manufacturers to leverage the Internet of Things (IoT) to advance engineering productivity and guard more effectively against events causing damage to the equipment. According to Bistel, the cloud-based FDC system offers the same level of quality and security as an on-premise system.